Agilent X series signal analyser

Agilent has released new options for the X-series of signal analysers designed to deliver wider bandwidth, faster measurement speed and more measurement capabilities.

The options specifically address the needs of wireless R&D and manufacturing engineers performing wideband signal demodulation analysis by providing quicker insight into signal analysis and faster, component characterisation.

A 40 MHz analysis bandwidth option for the MXA and EXA analysers delivers wideband signal analysis and measurement capabilities that include 40 MHz bandwidth CCDF measurement; burst power measurement; QPSK EVM measurement; IQ waveform measurement; 802.16e OFDM modulation analysis; and other complex digital modulation analysis.

A 25 MHz bandwidth option for the CXA signal analyser specifically addresses the wideband signal analysis requirement in low-cost R&D and consumer electronics manufacturing.

For test environments requiring even wider bandwidth, the highest performance PXA analyser offers up to 140 MHz of bandwidth.

A digital IF design feature in the MXA and EXA instruments expands analysis bandwidth to 40 MHz. It also adds an enhanced digital processor with deeper capture memory, up to 2 GB and real-time error correction to accelerate IQ acquisition.

The faster measurement speed ensures engineers have the speed their measurement tasks demand, as well as the flexibility to choose the X-series analyser that provides the best balance of cost and performance.

The X-series now offers the following two additional capabilities for device under test stimulus-response measurements.

An external source control capability on the CXA/EXA/MXA supports the MXG N5181/N5182A signal generator.

A built-in tracking generator (up to 6 GHz) on the low-cost CXA analyser ensures the fastest solution for component characterisation in low-cost, high-volume test environments.