Keysight Technologies PNA vector network analyser with spectrum analyser

Keysight Technologies has announced the addition of a high-performance spectrum analyser to its PNA and PNA-X series microwave vector network analysers (VNAs). Incorporating this functionality into a VNA simplifies system connections and saves time by putting high-speed spurious measurements in the instrument used to characterise S-parameters, compression and distortion in satellite equipment, defence electronics and commercial wireless devices.

With the spectrum analyser capability, the VNA can perform fast spurious searches across a broad frequency band, improving test throughput by as much as 500 times compared to existing approaches. Measurement results are said to be comparable to those obtained with fast, sophisticated standalone spectrum or signal analysers.

The VNA can also perform simultaneous spectrum measurements on all test ports. This capability reduces design cycle time by enabling one-connection characterisation of mixers, converters, amplifiers, modules or subsystems. Example measurements include LO, RF and IF feedthrough; harmonics; intermodulation products; and other higher order mixing products.

In-fixture and on-wafer measurements gain the benefits of VNA calibration and de-embedding, which correct receiver-response errors and also remove cable and fixture effects. The resulting improvement in test accuracy makes it possible to achieve narrower test margins and tighter device specifications.