Model generation

Monday, 01 June, 2009 | Supplied by: Keysight Technologies Australia Pty Ltd


Agilent has claimed a breakthrough for its nonlinear modelling technique for components such as amplifiers and transistors.

The X-parameters can be generated either from simulation with the company’s Advanced Design System EDA software or from the company’s test and measurement instruments, for faster communications-product development.

Until now, designers could not accurately measure, display and simulate the full amplitude and phase information of each spectral component in nonlinear designs. They also did not have access to an accurate nonlinear behavioural model that fully characterises and describes the nonlinear behaviour of their devices.

Now, X-parameters make it simple to capture nonlinear behaviour with the same ease and accuracy as measuring or simulating linear S-parameters.

The technology allows designers to capture the nonlinear behaviour of active components such as amplifiers and transistors and save them in transportable RF intellectual property for use in RF system or circuit designs in ADS.

The system enables X-parameter nonlinear model generation from simulation, allowing design houses to create nonlinear X-parameter models of their RFIC and MMIC; power amplifier modules; front-end modules; and multiport devices such as mixers.

This allows RF and microwave system designers to fully characterise systems early in the design cycle and before the hardware is fabricated.

X-parameter models protect the intellectual property from which they are generated while retaining the full nonlinear characteristics to share with circuit and system design partners.

Users can also generate X-parameter models with load pull characteristics — for accuracy over a wide range of terminating impedances — from ADS simulation or from measurement on a company NVNA using the load-pull system from Maury Microwave.

Online: www.keysight.com
Phone: 03 9566 1260
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