National Instruments NI PXIe-4135 source measure unit (SMU)

National Instruments has announced the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the device to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility for applications such as wafer-level parametric test, materials research and characterisation of low-current sensors and ICs.

Engineers can use the modular SMU to build parallel, high-channel-count systems in a compact form factor and benefit from up to 68 SMU channels in a single PXI chassis that can scale to hundreds of channels. Users can increase test throughput by taking advantage of a high-speed communication bus, deterministic hardware sequencing and a digital control loop technology to custom-tune the SMU response for any device under test. They can also control the SMU response through software, which removes long wait times for SMU settling and offers the flexibility to help minimise overshoot and oscillations.

The interactive soft front panels can be used for making basic measurements and debugging automated applications. The driver features help files, documentation and ready-to-run example programs to assist in test code development and includes a programming interface that works with a variety of development environments. Engineers can use the SMUs with NI’s TestStand test management software, simplifying the creation and deployment of test systems in the lab or on the production floor.

Originally published here.