Tektronix IsoVu TIVP Series isolated oscilloscope probes
Tektronix’s second-generation IsoVu isolated oscilloscope probes, the TIVP Series, are designed to extend the applications for isolated probe technology to the entire power system design market with a smaller size, improved ease of use and enhanced electrical performance. They are available in bandwidths ranging from 200 MHz to 1 GHz.
Making accurate measurements on high-speed ungrounded systems can be difficult using traditional differential probes, due to the high frequencies and switching speeds involved. By galvanically isolating the probe from the oscilloscope, IsoVu probes change how power researchers and designers make wide-bandgap power measurements. The second-generation probes make this isolated measurement technology accessible to a broader range of users for such tasks as product level R&D, validation and EMI troubleshooting.
The probes use electro-optical technologies to capture signals and power the probes without the need for an electrical connection to the oscilloscope. Compared to traditional high-voltage differential probes, they offer a combination of high bandwidth, dynamic range and good common-mode rejection ratio (CMRR) over the probe’s full bandwidth. The use of optical cables also allows for long cable lengths and makes the probes largely immune to EMI.
At about one-fifth the size of the first generation, the TIVP Series probes make it easy to access hard-to-reach measurement points that were previously inaccessible. Additionally, the separate controller box has been condensed and is now self-contained inside the probe’s compensation box. The probes are also more sensitive, with less noise at ±50 V measurements for greater visibility and voltage sensitivity in wide-bandgap measurements.
The probes are said to offer improved DC accuracy, enhanced gain accuracy over the full input range and improved temperature drift correction. These enhancements enable deeper characterisation of wide-bandgap designs for increased energy efficiency. With wider dynamic range at the sensor head, fewer tips are required to cover the same voltage range as the first-generation probes.
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