Waveform generator/fast measurement unit

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Agilent Technologies has introduced a waveform generator/fast measurement unit (WGFMU) for its B1500A semiconductor device analyser that performs the high-speed measurements required to characterise ultra-fast negative bias temperature instability (NBTI) and other applications such as pulsed IV, random telegraph signal (RTS), new types of non-volatile resistive memory like PRAM/ReRAM.

Designed for researchers and reliability engineers, the B1530A WGFMU for the B1500A is a self-contained module to offer the combination of arbitrary linear waveform generation (ALWG) with synchronised fast current or voltage (IV) measurement as fast as 5 ns (nanoseconds), enabling accurate high-speed IV characterisation.

Its capabilities resolve the problem of ultrahigh-speed NBTI characterisation and various other applications faced by engineers and scientists working on next-generation semiconductor devices.

Benefits of the Advanced NBTI/PBTI Solution (which includes the B1530A) include:

• ability to apply both DC and various type of AC stress;
• fast spot-threshold-voltage measurement starting within 1 microsecond after removal of the applied stress;
• rapid sweep-threshold-voltage measurement, supported in conjunction with fast-spot measurement and ALWG capability;
• ability to perform NBTI testing over a wide range of times (from 1 microsecond to seconds);
• synchronised measurement for up to 10 channels; and
• sample software for NBTI testing.