Boundary scan test

JTAG Technologies has released the JT 37 x 7 boundary scan controller rackmounted instrument packaged in a standard 19" x 1U form factor. The instrument supports all boundary-scan test applications including IEEE 1149.6 digital network testing as well as in-system programming of flash memories and programmable logic devices.

With its four fully compliant boundary-scan test access ports it delivers signal integrity at the target. In addition, it provides 256 programmable I/Os to further enhance test coverage.

TAPs and I/Os are available on the front panel of the unit and the TAPs can be combined for test purposes or ganged for high-throughput testing and ISP.

The TAPs can also be extended via flat cables from the front panel to satisfy special fixing requirements. I/O channels are individually programmable as input, output, bidirectional or tri-state and voltage thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3 for use with logic families.

To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.

The device is powered from and interfaces with the host computer via three standard formats: USB 2.0, ethernet 10/100 and IEEE 1394 Firewire. Test clock frequency is programmable up to 40 MHz allowing rapid application execution, especially important for flash programming, while TAP voltages can be set for a wide range of input and output characteristics.