Memory test set

Tektronix has released a test toolset for DDR2 and new DDR3 technology, the next generation of double data rate synchronous dynamic random access memory that will deliver higher performance data rates.

The test supports all speeds of DDR, DDR2 and DDR3, spans both analog and digital domains and is based on hardware and software.

The DDR3 standard supports data rates of 800 MT/s to 1600 MT/s with clock frequencies of 400 to 800 MHz, double the speed of DDR2.

DDR3 should be suitable for applications such as file servers, video on demand, encoding and decoding, gaming and 3D visualisation.

For digital validation and debug, the TLA7000 logic analyser and the TLA7BB4 acquisition module provide the only logic analysis solution available to address all speeds of DDR, DDR2 and DDR3, including DDR3-1600.

The DDR test set provides a cost savings up to 30% over existing approaches. The TLA7BB4 with Nexus Technology DDR3/DDR2 protocol violation software automates the analysis of a DDR2 or DDR3 bus to identify protocol violations, frequency of those violations and also provide a global view of all the DDR commands in the logic analyser memory.

With memory support and probing solutions, the TLA7000 series provides a solution for digital validation and debug.

For analog validation and debug, the DDR analysis option on the DSA7000 family of digital serial analysers along with matching P7500 TriMode active differential probes and DPOJET measurement software, provide a debug toolset that automatically identifies reads and writes and performs clock, jitter, amplitude, timing and eye diagram measurements.