Xenics XFPA-1.7-640-LN₂ SWIR detector

The XFPA-1.7-640-LN₂ SWIR detector is designed to have low noise and high sensitivity for low-light-level measurements. The product is suitable for R&D spectroscopy or semiconductor failure analysis tasks. These demanding applications, where very low light levels need to be measured, require image sensors with low dark current, low noise and good responsitivity in the SWIR range.

The InGaAs detector is optimised for 77K operation, using liquid nitrogen (LN₂) cooling, and is based on an SFD (source follower per detector) read-out topology for ultralow noise levels (<20 e-). Additionally, a very low dark current of less than 5 e-/pixel allows for integration times of several hours.

The high-resolution 640 x 512 InGaAs detector with 20 µm pixel pitch features a maximum full frame rate of 2.5 Hz. The frame rate can be increased when a smaller region of interest is selected. A non-destructive read-out mode simplifies operation when long integration times are used.

Key benefits of the product are: low noise; high sensitivity; low dark current; long integration time; measures extremely low light signals; extends SWIR imaging to the visible.