Teledyne DALSA Genie Nano-CXP series CMOS area scan cameras

Monday, 10 June, 2019 | Supplied by: Adept Turnkey Solutions

Teledyne DALSA has announced the Genie Nano-CXP series of CMOS area scan cameras. The image CMOS sensors range from 16–67 MP resolution with added CoaXPress 6.25 Gbps technology offering high speed, robust build quality for wide operating temperature, and a substantial feature set. They have been designed to minimise CPU usage and improve processing times for host applications by enabling maximum sustained throughput and ready-to-use image data.

Offering 25 million pixels at 80 fps in a small form factor, the cameras are engineered to deliver high-speed results for applications such as semiconductor wafer inspection, electronics manufacturing, solar panel inspection and machine vision. Available in an all-metal body, they include a Trigger-to-Image Reliability (T2IR) framework that is designed to improve the reliability of the user’s inspection system and protect from data loss. They are GenICam and GenCP compliant.

Phone: 08 9242 5411
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