Rohde & Schwarz R&S RT-ZP1X passive probe for oscilloscopes

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The R&S RT-ZP1X passive 1:1 probe, from Rohde & Schwarz, broadens the application range of the R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscope’s front end are low noise, making this combination suitable for measuring the smallest of signals down to 1 mV/div, eg, for power integrity measurements on integrated circuits and components.

The probe is precisely matched to the R&S RTE (up to 2 GHz) and the R&S RTO1000/2000 (up to 4 GHz) oscilloscopes. The oscilloscope’s low-noise front end keeps the noise floor under 650 µVpp (1 mV/div and 200 MHz bandwidth), even for a 1 MΩ input impedance. Other oscilloscopes achieve such values only for a 50 Ω input impedance.

With an acquisition rate of up to 1 million wfms/s, users quickly obtain meaningful measurement results, complete with histogram and all signal components. In the zoom view in 16 bit high-definition (HD) mode, even the smallest of signal details can be analysed and triggered.

To search for coupled interference signals, the oscilloscopes offer a hardware-based fast Fourier transform (FFT) that delivers the spectrum display practically in real time. This makes it possible, for example, to identify 10 MHz signals coupled to an adjacent clock line at a glance. Another feature is the zone trigger that can be used to graphically separate events such as out-of-limit conditions in the time and frequency domain.