JTAG Technologies DataBlaster JT 37x7/PXIe boundary-scan controller

JTAG Technologies’ DataBlaster JT 37x7/PXIe is a high-performance boundary-scan IEEE Std. 1149.1 controller. The unit offers support for the PXIe/Compact PCI-express slot format that features in some of the latest automatic test equipment based on the PXI(e) standards.

The DataBlaster JT 37x7/PXIe was developed to satisfy the growing requirements for high-speed in-system programming (ISP) of flash memories, serial memories and CPLDs as well as complex digital circuit testing. The ETT (Enhanced Throughput Technology) system offers users sustained test clock speeds of up to 40 MHz and features an onboard flash image buffer memory.

It is supplied with the complementary QuadPOD system which offers four synchronised TAPs (test access ports) able to support multiTAP test targets (UUTs) or gang programming of four single TAP targets. QuadPOD can also house the full range of JTAG Technologies’ SCIL modules, allowing the user to deploy custom test interfaces (BDM, I²C etc) or the mixed signal DAF (digital, analog frequency) measurement module.

The scalable DataBlaster JT 37x7/PXIe range starts with the entry model JT 3707/PXIe, suitable for high-speed test applications and in-system PLD programming. Companion models JT 3717/PXIe and JT 3727/PXIe, optionally fitted with an ETT module for flash ISP, support high-throughput flash programming as well as test and PLD programming.