Mini accelerometer
01 August, 2008 | Supplied by: Metromatics Pty Ltd
Dytran has introduced an ultra-miniature IEPE accelerometer with titanium housing. Weighing 0.2 g, this miniature accelerometer reduces mass loading effects.
Boundary scan interface
01 August, 2008 | Supplied by: ProDigital Pty Ltd
JTAG Technologies has released the JT 2147/AGP boundary scan interface for use with Aeroflex in-circuit testers.
Test management software
01 August, 2008 | Supplied by: National Instruments Aust Pty Ltd
National Instruments has announced NI TestStand 4.1, the latest version of the company’s test management software, which now helps engineers develop faster test systems with multicore processor support.
Olympic structures being monitored
31 July, 2008
The China Earthquake Administration, the government body managing the country’s earthquake preparedness and disaster mitigation, has selected a structural health monitoring system developed by National Instruments Alliance Partner CGM Engineering.
Digital phosphor ’scopes
01 July, 2008 | Supplied by: RS
RS Components has added the TDS3000C series of oscilloscopes from Tektronix to its range.
Linear measurement
01 July, 2008 | Supplied by: IDM Instruments
Available from IDM Instruments is the Celesco M150, claimed to be the world’s smallest cable extension transducer or string pot, measuring 1.9 x 1.9 x 1 cm.
Vector signal analysis
01 July, 2008 | Supplied by: Keysight Technologies Australia Pty Ltd
Agilent has introduced the VXA vector signal analyser measurement application for its X-series of signal analysers.
Four-channel DSOs
01 July, 2008 | Supplied by: Emona Instruments Pty Ltd
The latest series of 4-channel Rigol oscilloscopes is available from Emona Instruments.
15-bit waveform generators
01 July, 2008 | Supplied by: Keysight Technologies Australia Pty Ltd
Agilent now offers PXI-based and LXI-based 15-bit arbitrary waveform generators that can create simultaneous wide bandwidth and high-resolution signals for electronically testing radar, satellite, telecom or military communications equipment.
Arbitrary noise generator
01 July, 2008 | Supplied by: Keysight Technologies Australia Pty Ltd
Agilent has introduced what it claims is the industry’s first pulse function arbitrary noise generator that provides signal quality combined with versatile waveforms. It is suitable for general-purpose bench tests or serial data stress tests.
Impedance analysers
01 July, 2008 | Supplied by: Scientific Devices Australia
A range of precision impedance analysers with maximum frequencies ranging from 5 to 120 MHz for production, test and research applications has been introduced by Wayne Kerr Electronics.
13 GHz oscilloscope for PCI Express 2.0 compliance testing
09 June, 2008 | Supplied by: http://www.agilent.com/find/90000A
Agilent Technologies has announced that its Infiniium 90000A Series 13 GHz oscilloscopes have been approved by the PCI-SIG (PCI Special Interest Group) for PCI Express 2.0 electrical signal quality testing. This approval means designers can use Agilent's DSO/DSA91304A Infiniium oscilloscope to test and validate designs with confidence they will meet PCIe physical layer specifications.
Vector network analysers
09 June, 2008 | Supplied by: Rohde & Schwarz (Australia) Pty Ltd
The R&S ZVT8/ZVT20 8/20 GHz network analyser offers up to eight/six test ports in a single unit. Each port is equipped with a reflectometer that consists of a VSWR bridge, a measurement receiver and a reference receiver. Each pair of reflectometers is equipped with an independent generator.
DELETE - duplicated somehow - 13 GHz oscilloscope for PCI Express 2.0 compliance testing
03 June, 2008 | Supplied by: http://www.agilent.com/find/90000A
Agilent Technologies has announced that its Infiniium 90000A Series 13-GHz oscilloscopes have been approved by the PCI-SIG (PCI Special Interest Group) for PCI Express 2.0 electrical signal quality testing. This approval means designers can use Agilent's DSO/DSA91304A Infiniium oscilloscope to test and validate designs with confidence they will meet PCIe physical layer specifications.
Waveform generator/fast measurement unit
08 May, 2008 | Supplied by: http://www.agilent.com/find/B1500A
Agilent Technologies has introduced a waveform generator/fast measurement unit (WGFMU) for its B1500A semiconductor device analyser that performs the high-speed measurements required to characterise ultra-fast negative bias temperature instability (NBTI) and other applications such as pulsed IV, random telegraph signal (RTS), new types of non-volatile resistive memory like PRAM/ReRAM.
